G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials Revision:SEMI G60-94 (Reapproved 0318) - Inactive 1 This Guide is intended

1  This Guide is intended in general for metrology on low stiffness substrates like wafers or other geometrical shapes such as panels

org in July 2009

This Specification is designed to meet the requirements of automated assembly

SEMI E94-1101 (technical revision)

G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials Revision:SEMI G60-94 (Reapproved 0318) - Inactive 1 This Guide is intendedThis Test Method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge. This Test Method is suitable for all interleaf materials and may be used by vendors at outgoing inspection, or customers at incoming inspection. Referenced SEMI StandardsNone.